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TCD1252AP 2001-10-15 1 toshiba ccd linear image sensor ccd(charge coupled device) TCD1252AP the TCD1252AP is a high sensitive and low dark current 2700 ? elements linear image sensor. the sensor can be used for facsimile, imagescanner and ocr. the device contains a row of 2700 photodiodes, which provide a 8 lines / mm (200 dpi) across a a3 size paper and a 12 lines / mm (300dpi) across a a4 size paper. the device is operated by 5v (pulse), and 12v power supply. features number of image sensing elements : 2700 image sensing element size : 11m by 11m on 11m centers photo sensing region : high sensitive low dark current clock : 2 phase (5v) package : 22 pin dip (t ? capp) toshiba ? ccd ? advanced ? plastic-package maximum ratings (note 1) characteristic symbol rating unit clock pulse voltage v shift pulse voltage v sh reset pulse voltage v rs power supply voltage v od ? 0.3~8 v operating temperature t opr ? 25~60 c storage temperature t stg ? 40~100 c note 1: all voltage are with respect to ss terminals (ground). weight: 2.7g (typ.) pin connection (top view)
TCD1252AP 2001-10-15 2 circuit diagram pin names 1 clock (phase 1) 2 clock (phase 2) sh shift gate rs reset gate os signal output dos compensation output od power ss ground nc non connection
TCD1252AP 2001-10-15 3 optical / electrical characteristics (ta = 25c, v od = 5v, v = v sh = v rs = 5v (pulse), f = 0.5mhz, f rs = 1mhz,), load resistance=100k ? , t int (integration time) = 10ms light source = daylgiht fluorescent lamp) characteristic symbol min typ. max unit note sensitivity r 44 63 82 v / lxs (note 2) prnu (1) D D 10 % (note 3) photo response non uniformity prnu (3) D 7 16 mv (note 10) register imbalance ri D D 3 % (note 4) saturation output voltage v sat 1.0 1.5 D v (note 5) saturation exposure se D 0.02 D lxs (note 6) dark signal voltage v drk D 2 6 mv (note 7) dark signal non uniformity dsnu D 3 7 mv (note 7) dc power dissipation p d D 35 100 mw total transfer efficiency tte 92 D D % output impedance z o D D 1 k ? ? dynamic range dr D 750 D D (note 8) dc signal output voltage v os 2.5 3.5 4.5 v (note 9) dc compensation output voltage v dos 2.5 3.5 4.5 v (note 9) dc mismach voltage |v os ? v dos | D 50 100 mv (note 9) random noise nd ? D 1.5 D mv (note 11) note 2: sensitivity for 2856k w ? lamp is 105v / lxs (typ.) sensitivity for led (567nm) is 22.7v / lxs (typ.) note 3: measured at 50% of se (typ.) definition of prnu = prnu = () % 100 ? where is average of total signal outputs and ? is the maximum deviation from under uniform illumination. note 4: measured at 50% of se (typ.) ri is defined as follows: ri = () % 100 2699 1 n n 2699 1 n + ? = where n and n+1 are signal outputs of each pixel. v is average of total signal outputs. note 5: v sat is defined as minimum saturation output voltage of all effective pixels. note 6: definition of se : = () s lx r sat v
TCD1252AP 2001-10-15 4 note 7: v drk is defined as average dark signal voltage of all effective pixels. dsnu is defined as different voltage between v drk and v mdk when v mdk is maximum dark signal voltage. note 8: definition of dr : drk v sat v dr 1 v drk is proportional to t int (integration time). so the shorter t int condition makes wider dr value. note 9: dc signal output voltage and dc compensation output voltage are defined as follows: note 10: prnu (3) is defined as maximum voltage with next pixel where measured 5% of se (typ.).
TCD1252AP 2001-10-15 5 note 11: 1. definition random noise is defined as the standard deviation (sigma) of the output level differencebetween two adjacent effective pixels under no illumination (i.e. dark condition) calculated by the following procedure. 2. calculation procedurethe following is the calculation procedure of random noise. 1) two adjacent pixels (pixel n and n+1) in one reading are fixed as measurement points. 2) each of the output levels at video output period is averaged over 200 nanosecond periodto get vn and vn+1. 3) vn+1 is subtracted from vn to get ? v. ? v=vn ? vn+1 4) the standard deviation of ? v is calculated after procedure 2) and 3) are repeated 30 times (30 readings). = ? = ? 30 1 i i v 30 1 v () = ? = 30 1 j 2 ? v ? vi 30 1 5) procedure 2), 3) and 4) are repeated 10 times to get 10 sigma values. = = 10 1 j j 10 1 6) value calculated using the above procedure is observed 2 times larger than that measured relative to the ground level. so we specify the random noise as the following. random noise () = 2 1 d n
TCD1252AP 2001-10-15 6 operating condition characteristic symbol min typ. max unit ?h? level 4.5 5 5.5 clock pulse voltage ?l? level v 0 0 0.3 v ?h? level 4.5 5 5.5 shift pulse voltage ?l? level v sh 0 0 0.3 v ?h? level 4.7 5 5.5 reset pulse voltage ?l? level v rs 0 0 0.3 v power supply voltage v dd 4.7 5.0 5.3 v clock characteristics (ta = 25c) characteristic symbol min typ. max unit clock pulse frequency f ? 0.15 0.5 1.5 mhz reset pulse frequency f rs 0.3 1 3 mhz clock capacitance c ? D 200 300 pf shift gate capacitance c sh D 100 200 pf reset gate capacitance c rs D 10 30 pf
TCD1252AP 2001-10-15 7 timing chart
TCD1252AP 2001-10-15 8 timing requirements characteristic symbol min typ. (note12) max unit pulse timing of sh and 1 (note 14) t1, t5 500 1000 D ns sh pulse rise time, fall time t2, t4 0 50 D ns sh pulse width (note 14) t3 1000 2000 D ns 1, 2 pulse rise time, fall time t6, t7 0 100 D ns rs pulse rise time, fall time t8, t10 0 20 60 ns rs pulse width t9 40 250 D ns pulse timing of 1, 2 and rs t11 230 D D ns video data delay time (note 13) t12, t13 D 120 D ns t14 D 10 D ns rs noise delay time t15 D 200 D ns note 12: typ. is the case of f rs =1mhz note 13: load resistance is 100k ? note 14: this condition is shr=0 ?
TCD1252AP 2001-10-15 9 typical performance curves
TCD1252AP 2001-10-15 10 typical perfomance curves
TCD1252AP 2001-10-15 11 typical drive circuit
TCD1252AP 2001-10-15 12 caution 1. window glass the dust and stain on the glass window of the package degrade optical performance of ccd sensor. keep the glass window clean by saturating a cotton swab in alcohol and lightly wiping the surface, and allow the glass to dry, by blowing with filtered dry n2. care should be taken to avoid mechanical or thermal shock because the glass window is easily to damage. 2. electrostatic breakdown store in shorting clip or in conductive foam to avoid electrostatic breakdown. ccd image sensor is protected against static electricity, but interior puncture mode device due to static electricity is sometimes detected. in handing the device, it is necessary to execute the following static electricity preventive measures, in order to prevent the trouble rate increase of the manufacturing system due to static electricity. a. prevent the generation of static electricity due to friction by making the work with bare hands or by putting on cotton gloves and non-charging working clothes. b. discharge the static electricity by providing earth plate or earth wire on the floor, door or stand of the work room. c. ground the tools such as soldering iron, radio cutting pliers of or pincer. it is not necessarily required to execute all precaution items for static electricity. it is all right to mitigate the precautions by confirming that the trouble rate within the prescribed range. 3. incident light ccd sensor is sensitive to infrared light. note that infrared light component degrades resolution and prnu of ccd sensor. 4. lead frame forming since this package is not strong against mechanical stress, you should not reform the lead frame. we recommend to use a ic-inserter when you assemble to pcb. 5. soldering soldering by the solder flow method cannot be guaranteed because this method may have deleterious effects on prevention of window glass soiling and heat resistance. using a soldering iron, complete soldering within ten seconds for lead temperatures of up to 260c, or within three seconds for lead temperatures of up to 350c.
TCD1252AP 2001-10-15 13 package dimensions note 1: no. 1 sensor element (s1) to edge of package. note 2: top of chip to bottom of package. note 3: glass thicknes (n=1.5) note 4: no. 1 sensor element (s1) to center of no. 1 pin. weight: 2.7g (typ.)
TCD1252AP 2001-10-15 14 ? toshiba is continually working to improve the quality and reliability of its products. nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. it is the responsibility of the buyer, when utilizing toshiba products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such toshiba products could cause loss of human life, bodily injury or damage to property. in developing your designs, please ensure that toshiba products are used within specified operating ranges as set forth in the most recent toshiba products specifications. also, please keep in mind the precautions and conditions set forth in the ?handling guide for semiconductor devices,? or ?toshiba semiconductor reliability handbook? etc.. ? the toshiba products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). these toshiba products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (?unintended usage?). unintended usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. unintended usage of toshiba products listed in this document shall be made at the customer?s own risk. ? the products described in this document are subject to the foreign exchange and foreign trade laws. ? the information contained herein is presented only as a guide for the applications of our products. no responsibility is assumed by toshiba corporation for any infringements of intellectual property or other rights of the third parties which may result from its use. no license is granted by implication or otherwise under any intellectual property or other rights of toshiba corporation or others. ? the information contained herein is subject to change without notice. 000707eb a restrictions on product use

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